Phantom Layer Revealed

Microstructural characterization of an Fe-Ni-P-C alloy was conducted using scanning electron microscope (SEM) equipped with Energy Dispersive Spectroscopy (EDS) detectors at the UNB Microscopy and Microanalysis Facility. The image features the EDS map for Phosphorus. Interestingly, it generated two layers: the foreground and the background in which only the former was visible during the SEM scan. This discrepancy occurs because the EDS scan penetrates beyond the sample surface given sufficient acquisition time, whereas the SEM scan captures only the surface morphology. Depending on the applied voltage, the interaction volume, and the attenuation length of the X-rays will vary. Interpreting the stratified results from SEM (for surface topography) and EDS (for elemental distribution) were vital to understanding the Fe-Ni-P-C alloy system towards the goal of developing a sustainable magnet.